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30
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Hernández Saz, Jesús
(1)
Jiménez Ríos, Juan Jesús
(1)
Richard, Diego
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semiconductor
(3)
Ciencias Exactas
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(1)
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InGaN
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InN
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atom probe tomography
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caracterización
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2009
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Subject:
semiconductor
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(0.008 seconds)
Title:
Estudio experimental y de cálculos de primeros principios del semiconductor Sc
2
O
3
dopado con
111
In →
111
Cd,
181
Hf →
181
Ta y
44
Ti →
44
Sc
Author:
Richard, Diego
Language:
Español
Repository:
37
Subject:
Ciencias Exactas
/
Física
/
Cálculo
/
Materia condensada
/
semiconductor
/
impurezas
/
gradiente de campo eléctrico
Acceder
Title:
Análisis tomográfico a nanoescala de materiales nanoestructurados para dispositivos fotovoltaicos / Analysis at Nanoscale by Tomography Techniques of Nanostructured Materials for Photovoltaics
Author:
Hernández Saz, Jesús
Language:
Español
Repository:
30
Subject:
semiconductor
/
electron tomography
/
tomografía electrónica
/
atom probe tomography
/
tomografía de sonda atómica
/
TEM
/
photovoltaic
/
solar cells
/
energía renovable
/
caracterización
/
nanoescala
/
nanoscale
/
renewable energy
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Title:
Estudios de estructura y composición de heteroestructuras In(N)/InGaN/Si para tecnología solar basada en nuevos conceptos
Author:
Jiménez Ríos, Juan Jesús
Language:
Español
Repository:
30
Subject:
InGaN
/
semiconductor
/
celdas solares
/
heteroestructura
/
InN
/
optoelectrónica
Acceder
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