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61
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Author
Marrugo A.G.
(3)
Pineda J.
(2)
Romero L.A.
(2)
Vargas R.
(2)
Abegão G., Luis M
(1)
Altamar-Mercado H.
(1)
De Boni, Leonardo
(1)
Fonseca, Ruben D.
(1)
Forero N.
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Kamada, Kenji
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Photonics
(4)
Profilometry
(2)
2d digital image correlations
(1)
3D strain
(1)
A-particles
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Adaptive filtering
(1)
Adaptive filters
(1)
Contour measurement
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Deformation analysis
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Year:
2018
Subject:
Photonics
Language:
Inglés
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Title:
First molecular electronic hyperpolarizability of two oxazoles dyes in solution / Primera hiperpolarizabilidad electrónica molecular de dos tintes de oxazoles en solución.
Author:
Abegão G., Luis M
/
Fonseca, Ruben D.
/
Santos, Francisco A.
/
Piguel, Sandrine
/
Rodrigues, José Joatan
/
Mendonça Renato, Cleber
/
Kamada, Kenji
/
De Boni, Leonardo
Language:
Inglés
Repository:
57
Subject:
Photonics
/
Quantum chemistry
/
Fotónica
/
Química Cuántica
Acceder
Title:
A particle swarm optimization approach to log-gabor filtering in fourier transform profilometry
Author:
Pineda J.
/
Meza J.
/
Marrugo A.G.
/
Vargas R.
/
Romero L.A.
Language:
Inglés
Repository:
61
Subject:
Contour measurement
/
Particle swarm optimization (PSO)
/
Photonics
/
Profilometry
/
A-particles
/
Fourier transform profilometry
/
Log gabor
/
Gabor filters
Title:
Adaptive filtering of interference fringes by polar transformation and empirical mode decomposition
Author:
Altamar-Mercado H.
/
Patiño-Vanegas A.
/
Marrugo A.G.
Language:
Inglés
Repository:
61
Subject:
Adaptive filtering
/
Photonics
/
Empirical mode decomposition
/
Extended depth of field
/
Interference fringe
/
Interference microscopy
/
Polar transformations
/
Adaptive filters
Title:
An experimental study on deformation analysis of an indented pipe via fringe projection profilometry and digital image correlation
Author:
Forero N.
/
Marrugo A.G.
/
Vargas R.
/
Pineda J.
/
Useche J.
/
Romero L.A.
Language:
Inglés
Repository:
61
Subject:
Image analysis
/
Profilometry
/
Strain measurement
/
2d digital image correlations
/
3D strain
/
Deformation analysis
/
Digital image correlations
/
Fringe projection profilometry
/
Surface displacement
/
Photonics
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