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Year: 2008 Document Type: Conferencia Repository: 54 Subject: FRD

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Title: Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
Author: Morel, Eneas / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Coherence Interferometry / Michelson-Sagnac configuration

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