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61 (3)

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Author

Marrugo A.G. (3)
Romero L.A. (3)
Meneses J. (2)
Pineda J. (2)
Vargas R. (2)
Altamar-Mercado H. (1)
Marrugo J. (1)

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Image reconstruction (3)
Profilometry (3)
Data handling (2)
Fourier transform profilometry (2)
Fringe projection (2)
Imaging systems (2)
Medical imaging (2)
3-d shape measurement (1)
3D data processing (1)
3D imaging (1)

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2019 (3)
2020 (3)

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Conferencia (3)

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Query: SOCIETY Document Type: Conferencia Subject: Profilometry Year: 2019

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1-3 from 3 results (0.01 seconds)

Title: Toward an automatic 3D measurement of skin wheals from skin prick tests
Author: Marrugo A.G. / Romero L.A. / Pineda J. / Vargas R. / Altamar-Mercado H. / Marrugo J. / Meneses J.
Language: Inglés
Repository: 61
Subject: 3D medical imaging / 3D skin measurement / Allergy diagnosis / Fourier transform profilometry / Fringe projection / Skin prick test / Skin wheals / Allergies / Data handling / Diagnosis / Imaging systems / Medical imaging / Profilometry / 3D data processing / Automatic measurements / Conventional approach / Diagnosis of allergies / Observer variations / Image reconstruction
Title: A flexible and simplified calibration procedure for fringe projection profilometry
Author: Vargas R. / Marrugo A.G. / Pineda J. / Romero L.A.
Language: Inglés
Repository: 61
Subject: 3D shape measurement / Calibration / Fringe projection profilometry / Data handling / Inverse problems / Mapping / Profilometry / Stereo image processing / Stereo vision / 3-d shape measurement / Calibration procedure / Low computational complexity / Reconstruction process / Simplified calibrations / Three dimensional (3 D) shape measurement / Triangulation principles / Image reconstruction
Title: Wide-field 3D imaging with an LED pattern projector for accurate skin feature measurements via Fourier transform profilometry
Author: Marrugo A.G. / Romero L.A. / Meneses J.
Language: Inglés
Repository: 61
Subject: 3D imaging / Fourier transform profilometry / Fringe projection / Medical imaging / Skin metrology / Structured light / Contour measurement / Fourier transforms / Image reconstruction / Imaging systems / Light emitting diodes / Profilometry / Surface scattering / Feature measurement / Global coordinate systems / Grating projection / Structured Light / Subsurface scattering

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