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Repository
61
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Author
Marrugo A.G.
(2)
Vargas R.
(2)
Altamar H.
(1)
Contreras S.
(1)
Martinez-Santos J.C.
(1)
Millan M.S.
(1)
Patino A.
(1)
Pineda J.
(1)
Romero L.A.
(1)
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Subject
Image processing
(3)
Signal processing
(3)
Vision
(3)
Background components
(1)
Bi dimensional empirical mode decomposition (BEMD)
(1)
Bi-dimensional empirical mode decompositions
(1)
Blind deconvolution
(1)
Blood vessels
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Contour measurement
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Controlled conditions
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2016
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2020
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Query:
COMPUTER VISION
Year:
2020
Year:
2016
Subject:
Vision
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3
results
(0.014 seconds)
Title:
Speckle free optical watermarking based on pseudo-random phase encoding
Author:
Patino A.
/
Altamar H.
/
Martinez-Santos J.C.
Language:
Inglés
Repository:
61
Subject:
Diffusers (optical)
/
Encoding (symbols)
/
Geometrical optics
/
Image coding
/
Image processing
/
Speckle
/
Vision
/
Watermarking
/
Input planes
/
Noise speckle
/
Numerical results
/
Optical applications
/
Optical image
/
Pseudo random
/
Random-phase encoding
/
Verification process
/
Signal processing
Title:
On the compensation of uneven illumination in retinal images for restoration by means of blind deconvolution
Author:
Marrugo A.G.
/
Vargas R.
/
Contreras S.
/
Millan M.S.
Language:
Inglés
Repository:
61
Subject:
Blood vessels
/
Convolution
/
Medical imaging
/
Ophthalmology
/
Optical transfer function
/
Restoration
/
Signal processing
/
Vision
/
Bi dimensional empirical mode decomposition (BEMD)
/
Blind deconvolution
/
Controlled conditions
/
Illumination compensation
/
Illumination distribution
/
Multi channel
/
Nonstationary signals
/
Uneven illuminations
/
Image processing
Title:
Background intensity removal in structured light three-dimensional reconstruction
Author:
Vargas R.
/
Pineda J.
/
Marrugo A.G.
/
Romero L.A.
Language:
Inglés
Repository:
61
Subject:
Contour measurement
/
Image processing
/
Information filtering
/
Mathematical morphology
/
Mathematical transformations
/
Profilometry
/
Vision
/
Background components
/
Bi-dimensional empirical mode decompositions
/
Filtering procedures
/
Fourier transform profilometry
/
High order spectra
/
Morphological operations
/
Sequential combination
/
Three-dimensional reconstruction
/
Signal processing
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