OPAC

A problem has been found

A problem has ocurred in the communication with the server.

Please, try again later. If the problem persists, contact the admin

Your search

Subject: FRD Repository: 54 Year: 2008 Document Type: Conferencia

Sort by Score Title Year -

1-1 from 1 results (0.008 seconds)

Title: Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
Author: Morel, Eneas / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Coherence Interferometry / Michelson-Sagnac configuration

Acceder

« Previous 1 Next »