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Campo Yepes, John Jairo
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Subject:
Efficiency
Subject:
Aprendizaje
Year:
2017
Document Type:
Tesis
Language:
Español
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Title:
Modelos Apilados y factores que pueden afectar la eficiencia
Author:
Campo Yepes, John Jairo
/
Cruz Castro, Daniel Leonardo
Language:
Español
Repository:
40
Subject:
Metaclasificadores
/
Aprendizaje
/
Eficiencia
/
Aprendizaje automático
/
Metaclassifiers
/
Learning
/
Efficiency
/
Automatic learning
/
Modelos lineales (Estadística)
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Estadística matemática
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Modelos matemáticos (Estadística)
/
Modelos estadísticos
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