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Subject: DNA Testing Year: 2020 Year: 2017 Language: Inglés

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Title: Physical-aware pattern selection for stuck-at faults
Author: Patino O.A. / Martinez-Santos J.C.
Language: Inglés
Repository: 61
Subject: Defects / Testing / Basic faults / Characteristics of defect / Defect detection / Detecting defects / Pattern Generation / Pattern selection / Stuck-at faults / Test pattern selections / Fault detection

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