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Subject: Aplicación electrónica Subject: Thin-films Repository: 34 Year: 2018

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Title: Thickness measurement and optical characterization of dielectric thin-films using surface plasmon resonance
Author: Orejel Orejel, Robin
Language: Inglés
Repository: 34
Subject: SPR / Dielectric thickness / Thin-films / Surface Plasmon Resonance / electrónica / engineering / Ciencias / Sciences

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