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Subject: -methylenation Subject: FRD Language: Inglés Document Type: Artículo

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Title: Development of bioremediation strategies based on the improvement of biomass production from isolated strains in hydrocarbon contaminated soils and their application in bioremediation technologies.
Author: Conde Molina, Débora / Liporace, Franco / Quevedo, Carla
Language: Inglés
Repository: 54
Subject: UTN / FRD / Biorremediación / Suelos contaminados / Hidrocarburos / Microcosmos

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Title: Large Axial Range Frequency-Domain Optical Low Coherence Interferometry
Author: Cerrotta, Santiago / Morel, Eneas / Alvira, Fernando / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Optical Interferometry / Optical Variables Measurement / Dynamic Range / Coherence / Tuning / Light sources / Optical Fibers

Acceder
Title: Accuracy and Mechanistic Details of Optical Printing of Single Au and Ag Nanoparticles
Author: Cerrotta, Santiago / Garjiulo, Julian / Violi, Lanina / Chvatal, Lukas / Cortes, Emiliano / Perassi, Eduardo / Diaz, Fernando / Zemánek, Pavel / Stefani, Fernando D.
Language: Inglés
Repository: 54
Subject: UTN / FRD / nanofabrication / optical forces / optical tweezers / colloidal patterning

Acceder
Title: Inclination shift signal: thickness or index measurement in transparent media by transmission of generally astigmatic Gaussian beams
Author: Aguilar, Andres / Torga, Jorge
Language: Inglés
Repository: 54
Subject: General astigmatism / Thickness measurement / Index measurement / Low-cost / UTN / FRD

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Title: Molecular rotational diusion detected by dierential fluorescence energy
Author: Torga, Jorge / Marconi, Mario / Negri, Martin / Aramendia, Pedro
Language: Inglés
Repository: 54
Subject: UTN / FRD / molecular rotational / fluorescence signal / ellipsoidal molecules / fluorescence energy

Acceder
Title: Transparent glass slab thickness measurement by binary-spot focus signal
Author: Aguilar, Andrés / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Focus-Error-Signal / Astigmatic / Thickness / Beam profilometer / Multiple spots

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Title: Wide band interferometryforthicknessmeasurement
Author: Constantino, Santiago / Martínez, Oscar / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Wide Band Interferometry / White-light Interferometry / Thicknessmeasurement

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Title: Fast scanner with position monitor forlargeopticaldelays
Author: Constantino, Santiago / Martínez, Oscar / Torga, Jorge / Do Campo, P. / Libertiun, A.R.
Language: Inglés
Repository: 54
Subject: UTN / FRD / Optical delay Fastscan Oscillating / Steppermotor Position monitor / Pump probe Autocorrelator

Acceder
Title: Dynamic Detection of Thicknesses in Polymer Deformation Based on the Optical Coherence Interferometry Technique
Author: Morel, Eneas / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Interferometries / Topography / Profilometry / Fast Fourier transform.

Acceder
Title: Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
Author: Scarpettini, Alberto / Bragas, Andrea Veronica
Language: Inglés
Repository: 54
Subject: UTN / FRD / FESOM / scanning optical microscopy / Plasmonic / harmonic demodulation

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