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Document Type: Artículo Subject: Reflection Year: 2020 Year: 2019

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Title: Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy
Author: Altamar-Mercado H. / Patiño-Vanegas A. / Marrugo A.G.
Language: Inglés
Repository: 61
Subject: Corrosion / Recovery / Reflection / Textures / 3D reconstruction / Accurate measurement / Engineered surfaces / Extensive simulations / Interference microscopy / Measurement accuracy / Standard deviation / Surface reflectivity / Surface roughness

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