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Repository
54
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Author
Morel, Eneas
(3)
Torga, Jorge
(3)
Aguilar, Andres
(1)
Bragas, Andrea Veronica
(1)
Duchowicz, Ricardo
(1)
Russo, Nélida A.
(1)
Scarpettini, Alberto
(1)
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FRD
(4)
UTN
(4)
FESOM
(1)
Fast Fourier transform.
(1)
Interferometries
(1)
OCT
(1)
Optical coherence tomography
(1)
Plasmonic
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Profilometry
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2015
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2020
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Language:
Inglés
Document Type:
Artículo
Year:
2015
Repository:
54
Subject:
FRD
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Title:
Dynamic Detection of Thicknesses in Polymer Deformation Based on the Optical Coherence Interferometry Technique
Author:
Morel, Eneas
/
Torga, Jorge
Language:
Inglés
Repository:
54
Subject:
UTN
/
FRD
/
Interferometries
/
Topography
/
Profilometry
/
Fast Fourier transform.
Acceder
Title:
Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
Author:
Scarpettini, Alberto
/
Bragas, Andrea Veronica
Language:
Inglés
Repository:
54
Subject:
UTN
/
FRD
/
FESOM
/
scanning optical microscopy
/
Plasmonic
/
harmonic demodulation
Acceder
Title:
Dual system increases the resolution of a low coherence interferometer system through a signal detector astigmatic focus
Author:
Morel, Eneas
/
Aguilar, Andres
/
Torga, Jorge
Language:
Inglés
Repository:
54
Subject:
UTN
/
FRD
/
OCT
/
low coherence interferometry
/
focus signal
/
displacement measurement and tomography
Acceder
Title:
Interferometric system based on swept source-optical coherence tomography scheme applied to the measurement of distances of industrial interest
Author:
Morel, Eneas
/
Russo, Nélida A.
/
Torga, Jorge
/
Duchowicz, Ricardo
Language:
Inglés
Repository:
54
Subject:
UTN
/
FRD
/
Optical coherence tomography
/
metrological instrumentation
/
distance measurement.
Acceder
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