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72
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Document Type:
Artículo
Repository:
72
Subject:
Tecnología Electrónica
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Inglés
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(0.026 seconds)
Title:
Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method
Author:
Martínez Viviente, Félix Lorenzo
/
Ruiz Merino, Ramón Jesús
/
Prado, A. del
/
San Andrés, E.
/
Mártil de la Plaza, Ignacio
/
González Díaz, G.
/
Jeynes, C.
/
Barradas, N.P.
/
Wang, L.
/
Reehal, H.S.
Language:
Inglés
Repository:
72
Subject:
Hidrógeno
/
Silicona
/
Electrónica
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